Surface profiler
Main specifications 1. Highest resolution: 0.38 Å 2. Testing repeatability: 5.0 Å or 0.1% 3. Minimum positive pressure during scanning: 0.03 mg 4. Total Number of measured sampling points: 400,000 5. Measuring range: 1200um 6. Sample stage XY motor drive: 150×150mm 7. Sample stage size: ≥120mm Main functions 1.Equipped with...
Energy Dispersive X-Ray Fluorescence Spectrometer
Main specifications 1. 15W Ultra high performance X-ray Tube with a Rhodium anode 2. 30mm2SDD Drift Detector, with temperature and pressure sensors 3. 7 filters (blank, Cu500μm, Al50μm, Al200μm, Ti7μm，Ag100μm, Cu300μm) 4. Standard sample stage, 10 position autosampler 5. He gas purging for light elements analysis Main functions 1. Elemental...
High-contrast Transmission Electron Microscope
Main specifications 1. Electron Source: high-brightness Schottky X-FEG electron source; 2. TEM mode information limit: 0.18 nm; 3. TEM mode point resolution: 0.30 nm; 4. STEM HAADF mode resolution: 0.20 nm; 5. Accelerating Voltage: 80 kV, 200 kV; 6. Probe current:>=1.2 nA@1nm (at 200 kV); 7. Scanning transmission (STEM) mode:...
High-resolution Transmission Electron Microscope
Main specifications 1. Electron Source: high-brightness Schottky X-FEG electron source; 2. TEM mode information limit: 0.12 nm; 3. TEM mode point resolution: 0.25 nm; 4. STEM HAADF mode resolution: 0.16 nm; 5. Accelerating Voltage: 80 kV, 200 kV; 6. Total beam current: >50 nA; 7. Probe current:>=1.5 nA@1nm(at 200kV); 8....
Ultra-high Resolution Scanning Electron Microscope (SEM) Regulus8230
Main specifications 1. Electron gun: Cold cathode field emission electron source; 2. Resolution：0.6nm@15kV ,0.7nm@1kV; 3. Magnification： 20 ~ 2,000,000x； 4. Accelerating voltage: 0.5 ~ 30 kV； 5. Landing voltage: 0.01 ~ 20 kV； 6. Specimen Stage: 6 ""specimen exchange device; 110×110mm 5 Axis motorized stage（XY: 0 ~110mm; Z: 1.5~40mm; R:...
Ultra-high Resolution Scanning Electron Microscope (SEM) Regulus8100
Main specifications 1. Electron gun: Cold cathode field emission electron source; 2. Resolution：0.7nm@15kV ,0.8nm@1kV; 3. Magnification： 20 ~ 1,000,000x； 4. Accelerating voltage： 0.5 ~ 30 kV； 5. Landing voltage：0.1 ~ 2 kV； 6. Specimen Stage：4""specimen exchange device； 7. EDX dector：Oxford AZtecLive UltimMax 65; 8. Equipped with vaccum transfer system; Main...
High Resolution Scanning Electron Microscope (SEM)
Main specifications 1. Electron Gun：Schottky Field Emission； 2. Resolution：1.2nm@30kV, 3.0nm@1kV； 3. Magnification： 10 ~ 600,000x； 4. Accelerating voltage： 0.5 ~ 30 kV； 5. Variable pressure mode：10~300Pa; 6. Specimen Stage：Maximum sample size: 200mm dia. x 80mmH; 100×50mm 5 Axis motorized stage (X: 0~100mm; Y: 0~50mm; Z: 3~65mm; R: 360o; T: -20...
Oven-110L-1
Main specifications 内腔体积为108升 HeatBALANCE功能，用于根据特定应用调整上部和下部加热组之间热量输出的分布。 调整围-50％ 至+50％ 之间 控温范围：高于环境温度10℃～ +300℃" Main functions 烘烤、干燥 Equipment usage instructions 若样品含有机、有害溶剂，请在使用仪器前处理好，避免污染环境
Oven-110L-2
Main specifications 内腔体积为108升 HeatBALANCE功能，用于根据特定应用调整上部和下部加热组之间热量输出的分布。 调整围-50％ 至+50％ 之间 控温范围：高于环境温度10℃～ +300℃" Main functions 烘烤、干燥 Equipment usage instructions 若样品含有机、有害溶剂，请在使用仪器前处理好，避免污染环境
Scanning Electron Microscope (SEM)
Main specifications 1. Tungsten Hairpin Filament Scanning Electron Microscope； 2. Resolution：3.0nm@30kV, 15nm@1kV； 3. Magnification： 5 ~ 300,000x； 4. Accelerating voltage： 0.3 ~ 30 kV； 5. Variable pressure mode：6 - 650 Pa; 6. Specimen Stage：Maximum sample size: 300mm dia. x 130mmH; 150×150mm 5 Axis motorized stage (X: 0~150mm; Y: 0~150mm; Z:...