Nano Analysis

Main specifications

1. Electron Source: high-brightness Schottky X-FEG electron source;

2. TEM mode information limit: 0.12 nm;

3. TEM mode point resolution: 0.25 nm;

4. STEM HAADF mode resolution: 0.16 nm;

5. Accelerating Voltage: 80 kV, 200 kV;

6. Total beam current: >50 nA;

7. Probe current:>=1.5 nA@1nm(at 200kV);

8. Scanning transmission (STEM) mode: high-angle annular dark field (HAADF), bright field (BF), annular dark field (ADF);

9. EELS detector size: 18μm^2 (2048 × 64 pixels);

10. EDX energy resolution: <=136 eV (Mn-Kα) and 10 kcps (output)

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Main functions

The Talos F200X transmission electron microscope provides the fastest, most accurate and quantitative multi-dimensional nanomaterial characterization and analysis capabilities. It can realize TEM and STEM imaging, selected area electron diffraction (SAED), energy-dispersive X-ray spectroscopy (EDX), tomography, in-situ heating, etc

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Precautions for sample testing

1. Magnetic (e.g. Fe, Co, Ni， Mn)/Biological/Contaminated/Organic samples will NOT BE ALLOWED;

2. For authorized users only;

3. Cancellation or Booking at least 2 days in advance----- Violation of the rules will be disqualified.

Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.

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Equipment usage instructions

1. Magnetic (e.g. Fe, Co, Ni， Mn)/Biological/Contaminated/Organic samples will NOT BE ALLOWED;

2. For authorized users only;

3. Cancellation or Booking at least 2 days in advance----- Violation of the rules will be disqualified.

Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.