Nano Analysis

Main specifications

1. Electron Source: high-brightness Schottky X-FEG electron source;

2. TEM mode information limit: 0.18 nm;

3. TEM mode point resolution: 0.30 nm;

4. STEM HAADF mode resolution: 0.20 nm;

5. Accelerating Voltage: 80 kV, 200 kV;

6. Probe current:>=1.2 nA@1nm (at 200 kV);

7. Scanning transmission (STEM) mode: high-angle annular dark field (HAADF), bright field (BF), annular dark field (ADF);

8. EDX energy resolution: <=129 eV (Mn-Kα) and 10 kcps (output)

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Main functions

The Talos F200C transmission electron microscope is a powerful and versatile system that provides the characterization of biomaterial samples in structural biology and polymer samples in nanotechnology research. It can realize TEM and STEM imaging, selected area electron diffraction (SAED), energy-dispersive X-ray spectroscopy (EDX), tomography, etc.

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Precautions for sample testing

1. Magnetic (e.g. Fe, Co, Ni, Mn)/Special organic/Contaminated samples will NOT BE ALLOWED;

2. For authorized users only;

3. Cancellation or Booking at least 2 days in advance----- Violation of the rules will be disqualified.

Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.

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Equipment usage instructions

1. Magnetic (e.g. Fe, Co, Ni, Mn)/Special organic/Contaminated samples will NOT BE ALLOWED;

2. For authorized users only;

3. Cancellation or Booking at least 2 days in advance----- Violation of the rules will be disqualified.

Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.