Surface Characterization Analyzer
Main specifications 相对压力测试范围：1.3 x 10e-9 to 1.0 P/P0 分析站数量：3个 压力传感器测量精度：1000 torr 0.12% reading， 10 torr 0.12% reading，0.1 torr 0.15% reading， 脱气站数量：6个 脱气站脱气温度范围：室温-400摄氏度 原位脱气温度范围：室温-300摄氏度 比表面积范围：最小0.0005m2/g 孔径分析范围：3.5 Å - 5000 Å 可选吸附气体：氮气，二氧化碳等 吸附温度控制系统：液氮，ISO Controller (0-70摄氏度） Main functions Micromeritics 3Flex是一款全自动运行的气体吸附仪，采用真空容量法原理，配置独立的脱气系统，仪器分析站和脱气站各具有独立真空系统。此仪器测得多孔材料进行吸附/脱附等温线，对数据分析后可得到多孔材料的比表面积、孔体积、孔径分布等相关信息。仪器具有超洁净歧管设计，每个分析站配有独立压力传感器，采用三级传感器，包括1000torr，10torr，0.1torr，适用于分子筛、MOFs等微孔介孔多空材料分析研究，在材料，医药、陶瓷、活性炭、炭黑、催化剂、储氢材料、燃料电池、锂电池等领域有广泛的应用。 Notes 预约为主机测试时间，测试前需要预处理样品，脱气，干燥，请根据样品测试需求，预留此时间。
Ellipsometer
Main specifications 1. Wide spectral range 193~1690 nm; 2. Automatic angle-changing base:45-90°; 3. Z axis: automatic movement, maximum stroke 18mm, minimum step size 1um; 4. Spot size: normal spot 4mm in diameter, micro spot 300um in diameter; 5. Measurement parameters include: spectral ellipsometry Ψ and Δ; percentage of transmitted and...
Surface profiler
Main specifications 1. Highest resolution: 0.38 Å 2. Testing repeatability: 5.0 Å or 0.1% 3. Minimum positive pressure during scanning: 0.03 mg 4. Total Number of measured sampling points: 400,000 5. Measuring range: 1200um 6. Sample stage XY motor drive: 150×150mm 7. Sample stage size: ≥120mm Main functions 1.Equipped with...
Energy Dispersive X-Ray Fluorescence Spectrometer
Main specifications 1. 15W Ultra high performance X-ray Tube with a Rhodium anode 2. 30mm2SDD Drift Detector, with temperature and pressure sensors 3. 7 filters (blank, Cu500μm, Al50μm, Al200μm, Ti7μm，Ag100μm, Cu300μm) 4. Standard sample stage, 10 position autosampler 5. He gas purging for light elements analysis Main functions 1. Elemental...
High-contrast Transmission Electron Microscope
Main specifications 1. Electron Source: high-brightness Schottky X-FEG electron source; 2. TEM mode information limit: 0.18 nm; 3. TEM mode point resolution: 0.30 nm; 4. STEM HAADF mode resolution: 0.20 nm; 5. Accelerating Voltage: 80 kV, 200 kV; 6. Probe current:>=1.2 nA@1nm (at 200 kV); 7. Scanning transmission (STEM) mode:...
High-resolution Transmission Electron Microscope
Main specifications 1. Electron Source: high-brightness Schottky X-FEG electron source; 2. TEM mode information limit: 0.12 nm; 3. TEM mode point resolution: 0.25 nm; 4. STEM HAADF mode resolution: 0.16 nm; 5. Accelerating Voltage: 80 kV, 200 kV; 6. Total beam current: >50 nA; 7. Probe current:>=1.5 nA@1nm(at 200kV); 8....
Ultra-high Resolution Scanning Electron Microscope (SEM) Regulus8230
Main specifications 1. Electron gun: Cold cathode field emission electron source; 2. Resolution：0.6nm@15kV ,0.7nm@1kV; 3. Magnification： 20 ~ 2,000,000x； 4. Accelerating voltage: 0.5 ~ 30 kV； 5. Landing voltage: 0.01 ~ 20 kV； 6. Specimen Stage: 6 ""specimen exchange device; 110×110mm 5 Axis motorized stage（XY: 0 ~110mm; Z: 1.5~40mm; R:...
Ultra-high Resolution Scanning Electron Microscope (SEM) Regulus8100
Main specifications 1. Electron gun: Cold cathode field emission electron source; 2. Resolution：0.7nm@15kV ,0.8nm@1kV; 3. Magnification： 20 ~ 1,000,000x； 4. Accelerating voltage： 0.5 ~ 30 kV； 5. Landing voltage：0.1 ~ 2 kV； 6. Specimen Stage：4""specimen exchange device； 7. EDX dector：Oxford AZtecLive UltimMax 65; 8. Equipped with vaccum transfer system; Main...
High Resolution Scanning Electron Microscope (SEM)
Main specifications 1. Electron Gun：Schottky Field Emission； 2. Resolution：1.2nm@30kV, 3.0nm@1kV； 3. Magnification： 10 ~ 600,000x； 4. Accelerating voltage： 0.5 ~ 30 kV； 5. Variable pressure mode：10~300Pa; 6. Specimen Stage：Maximum sample size: 200mm dia. x 80mmH; 100×50mm 5 Axis motorized stage (X: 0~100mm; Y: 0~50mm; Z: 3~65mm; R: 360o; T: -20...