Multipurpose X-Ray Diffractometer
Main specifications 1. Empyrean tube Cu LFF (HR): maximum voltage 50kV, maximum current 55mA, maximum power 1.8kW 2. scanning mode：θ/θ vertical geometry, mnimum step width: 0.0001° 3. Measurement Radius：240 mm Direct optical positioning and equipping with DC motors，angular accuracy 0.001° 4. PIXcel3D 2D Area detector 5. 5-Axis cradle (Chi-Phi-X-Y-Z) 6....
High Throughput Powder X-Ray Diffractometer
Main specifications 1. Empyrean tube Cu LFF (HR): maximum voltage 50kV, maximum current 55mA, maximum power 1.8kW 2. scanning mode：θ/θ vertical geometry, minimum step width: 0.0001° 3. Measurement radius：240 mm Direct optical positioning and equipping with DC motors, angular accuracy 0.001° 4. Standard and rotating reflectivity sample stage with 45...
X-Ray 3D Microscope (Micro-CT)
Main specifications 1. 光电耦合物镜探测器，物镜0.4X的最大三维视野50mm；物镜40X最高空间分辨率500nm。 2. X射线源最高工作电压160kV，最大功率10W。 3. 最大可测样品尺寸φ300mm×450mm。 4. 原位测试力值最大5KN，轴向位移最大10mm，轴向位移速度0.1mm/min -1mm/min。 5. 原位拉伸试验台的温度范围 -20℃ ~+160℃。 Main functions 1. 利用X射线穿透样品，探测器收集不同吸收信号，实现X射线全场成像 2. 可以对材料内部结构无损测试，并进行三维重构和切片表征 3. 复合材料、多孔材料、建筑材料、岩石三维孔隙结构、特征提取和定量分析与统计分布 4. 增材制造、金属、陶瓷内部缺陷检测；生成三维网格模型用于数值模拟计算或3D打印；电池、芯片、热电材料的失效分析 5. 纤维材料的取向分析；动植物组织学成像分析；材料拉伸或压缩断裂行为和加热试验的原位表征。 Precautions for sample testing 设备属于II类射线装置，按法规要求只容许已登记辐射工作人员操作，因此只接受送样测试，如有特别需要请联系管理员
Benchtop Powder X-Ray Diffractometer
Main specifications 1. Empyrean tube Cu LFF (HR): generator voltage 40kV, Current 7mA, maximum power 600kW 2. scanning mode：θ/θ vertical geometry, minimum step width: 0.0001° 3. Measurement radius：145 mm 4. Standard sample stage, 6 position autosampler 5. PIXcel1D 1D Strip detector Main functions 1. Phase identification and quantification analysis 2....
Atom Probe Tomography
Main specifications 1. Vacuum system of vacuum chamber: Level3, vacuum of the analysis chamber<1×10^-10 torr; 2. Max. voltage pulse frequency: 500 kHz; 3. Max. laser pulse frequency: 400kHz; 4. UV laser wavelength: 257.5nm; Finest focal spot:<3 µm； 5. Max. data collection rate ions/min: > 4M； 6. Time of Flight (TOF)...
Time-of-Flight Secondary Ion Mass Spectrometry with Orbitrap analyzer
Main specifications 1. Bi ion source for analysis, ion beam current: >40 nA, maximum repetition rate: 50 kHz (for all modes of operation). 2. Pulsed ion beam current: ≥ 40 pA, minimum pulsed beam diameter: ≤ 50 nm (for high-resolution imaging modes). Fast imaging mode available, minimum beam spot diameter:...
Multi-Technique Surface Analysis System（XPS, AES, UPS, LEIPS）
Main specifications 1. Monochromatic X-ray source system (electron gun, anode target and monochromator) 2. Energy Analyzer: Energy resolution on Ag: ≤ 0.48 eV at Ag3d5/2 (FWHM) 3. Argon Ion Gun Energy: 0 - 5 kV; GCIB argon cluster ion gun maximum energy: 20 kV 4. Energy resolution of Dual-Beam Charge...
Research Atomic Force Microscope
Main specifications 1. Scan range: X, Y-axis scan range is ≥90um × 90um, and Z-axis scan range is ≥10um. 2. Closed-loop noise of X,Y-axis is ≤150pm (1Hz-1kHz), and closed-loop noise of Z-axis is ≤35pm (1Hz-1kHz). 3. Scan speed: for a 1um scan range, the number of pixels scanned is at...
Multifunctional Atomic Force Microscope
Main specifications 1. Scan range: Standard 20μm scanner (XY: 20um, Z: 1.5um), large range 100μm scanner (XY: 100um, Z: 15um) 2. Noise level: Standard scanner less than 0.03nm (RMS) 3. Maximum XY range of ±2.5mm, Z-axis stepping motor (50nm/step) with a range of 10mm, drift less than 0.03nm/sec. 4. Sample...