Multifunctional Atomic Force Microscope
Asset number
MC-NA-0004
Model
AFM100 Plus
Brand
Hitachi
Asset Leader
侯思润 Dennis Sirun HOU
Contact email
Location
W1-124
Main specifications
1. Scan range: Standard 20μm scanner (XY: 20um, Z: 1.5um), large range 100μm scanner (XY: 100um, Z: 15um)
2. Noise level: Standard scanner less than 0.03nm (RMS)
3. Maximum XY range of ±2.5mm, Z-axis stepping motor (50nm/step) with a range of 10mm, drift less than 0.03nm/sec.
4. Sample stage: Metal sample stage with a diameter of 20 mm, equipped with a sample stage expansion module. The maximum sample size is 35 mm in diameter and 10 mm in height.
5. Scanner control voltage: XY (±200V/18Bit), Z (±200V/26Bit), scan line preview function, maximum four-channel preview, scan rotation ±180° (0.1° step).
6. Data acquisition: Four channels (maximum 2048 x 2048), two channels (maximum 4096 x 4096)."
Main functions
1. Electromagnetic performance testing accessories: Kelvin force microscope (KFM), piezoresponse force microscope (PRM), AC mode electrostatic force microscope EFM(AC), DC mode electrostatic force microscope EFM(DC), magnetic force microscope (MFM).
2. Electromagnetic characteristic measurement accessories: Scanning spreading resistance microscope (SSRM), conductive atomic force microscope (C-AFM), low current conductive atomic force microscope.
3. Mechanical measurement accessories: Viscoelastic atomic force microscope (VE-AFM), lateral modulation friction force microscope (LM-FFM), adhesive force microscope.