Double spherical Aberration-Corrected Transmission Electron Microscope
Main specifications 1. 电子枪: 高亮度肖特基场发射电子枪（配备单色器）; 2. TEM模式信息分辨率: 60 pm@300 kV; 3. STEM 模式分辨率: 50 pm@300 kV; 4. 加速电压: 30 kV, 60 kV, 200 kV, 300 kV; 5. 电子枪单色仪能量分辨率: 0.025eV 6. 分析束流:>=2 nA@0.14nm; 7. 扫描透射(STEM)模式: 包含三个探头，高角环形暗场探头(HAADF)、明场探头(BF)、环形暗场探头(ADF); 8. 电子能量损失谱EELS: 探测器尺寸: 18μm^2 (2048 × 64 pixels) Main functions Spectra 300 球差校正电子显微镜具有最为快速、准确且量化的多维纳米材料表征分析能力。可以实现TEM和STEM成像，选区电子衍射，能量色散X射线谱，电子能量损失谱，三维重构等功能。
High-contrast Transmission Electron Microscope
Main specifications 1. Electron Source: high-brightness Schottky X-FEG electron source; 2. TEM mode information limit: 0.18 nm; 3. TEM mode point resolution: 0.30 nm; 4. STEM HAADF mode resolution: 0.20 nm; 5. Accelerating Voltage: 80 kV, 200 kV; 6. Probe current:>=1.2 nA@1nm (at 200 kV); 7. Scanning transmission (STEM) mode:...
High-resolution Transmission Electron Microscope
Main specifications 1. Electron Source: high-brightness Schottky X-FEG electron source; 2. TEM mode information limit: 0.12 nm; 3. TEM mode point resolution: 0.25 nm; 4. STEM HAADF mode resolution: 0.16 nm; 5. Accelerating Voltage: 80 kV, 200 kV; 6. Total beam current: >50 nA; 7. Probe current:>=1.5 nA@1nm(at 200kV); 8....
Ultra-high Resolution Scanning Electron Microscope (SEM) Regulus8230
Main specifications 1. Electron gun: Cold cathode field emission electron source; 2. Resolution：0.6nm@15kV ,0.7nm@1kV; 3. Magnification： 20 ~ 2,000,000x； 4. Accelerating voltage: 0.5 ~ 30 kV； 5. Landing voltage: 0.01 ~ 20 kV； 6. Specimen Stage: 6 ""specimen exchange device; 110×110mm 5 Axis motorized stage（XY: 0 ~110mm; Z: 1.5~40mm; R:...
Ultra-high Resolution Scanning Electron Microscope (SEM) Regulus8100
Main specifications 1. Electron gun: Cold cathode field emission electron source; 2. Resolution：0.7nm@15kV ,0.8nm@1kV; 3. Magnification： 20 ~ 1,000,000x； 4. Accelerating voltage： 0.5 ~ 30 kV； 5. Landing voltage：0.1 ~ 2 kV； 6. Specimen Stage：4""specimen exchange device； 7. EDX dector：Oxford AZtecLive UltimMax 65; 8. Equipped with vaccum transfer system; Main...
High Resolution Scanning Electron Microscope (SEM)
Main specifications 1. Electron Gun：Schottky Field Emission； 2. Resolution：1.2nm@30kV, 3.0nm@1kV； 3. Magnification： 10 ~ 600,000x； 4. Accelerating voltage： 0.5 ~ 30 kV； 5. Variable pressure mode：10~300Pa; 6. Specimen Stage：Maximum sample size: 200mm dia. x 80mmH; 100×50mm 5 Axis motorized stage (X: 0~100mm; Y: 0~50mm; Z: 3~65mm; R: 360o; T: -20...
Scanning Electron Microscope (SEM)
Main specifications 1. Tungsten Hairpin Filament Scanning Electron Microscope； 2. Resolution：3.0nm@30kV, 15nm@1kV； 3. Magnification： 5 ~ 300,000x； 4. Accelerating voltage： 0.3 ~ 30 kV； 5. Variable pressure mode：6 - 650 Pa; 6. Specimen Stage：Maximum sample size: 300mm dia. x 130mmH; 150×150mm 5 Axis motorized stage (X: 0~150mm; Y: 0~150mm; Z:...
Environmental Scanning Electron Microscope (ESEM)
Main specifications 1. ESEM mode; 2. Resolution：3.0nm@30kV, 8.0nm@3kV (high vacuum)；3.0nm@30kV, 10nm@3kV (low vacuum)；3.0nm@30kV (ESEM); 3. Magnification： 5 ~ 1,000,000x； 4. Accelerating voltage： 0.2 ~ 30 kV； 5. Low vaccum: upto 130 Pa; 6. ESEM vacuum：up to 2600 Pa; 7. Specimen Stage：Maximum sample size: 122 dia. with full X, Y rotation;...