Fourier Transform Infrared Microscope
Main specifications 1. Vertex 70v Spectral range: 15500 ~ 50 cm-1； 2. Resolution: better than 0.16 cm-1； 3. Wavenumber accuracy: better than 0.005 cm-1; 4. Signal-to-noise ratio: higher than 55000:1; 5. DTGS, InGaAs and liquid nitrogen cooled MCT detectors; 6. Integral sphere； 7. ATR accessory, spectral range 12800~50 cm-1; 8....
UV/Vis/NIR Spectrophotometer
Main specifications 1. Wavelength range:175 ~ 3300 nm; 2. Resolution: <0.05 nm (ultraviolet visible region), <0.2 nm (near infrared region); 3. Wavelength accuracy: better than ±0.08 nm (ultraviolet visible region), better than ±0.30 nm (near infrared region); 4. Light source: deuterium lamp, iodine tungsten lamp; 5. A photomultiplier tube was...
X-Ray Single Crystal Diffractometer
Main specifications 1. 1.2KW Cu/Mo Dual Wavelength Microfocus Source 2. Working Voltage/Current: Cu: 40kV 30mA, Mo: 50kV 24mA 3. Hybrid Photon Counting 100o Arc Detector 4. Four Circle (Kappa) Goniometer 5. Oxford Stream 1000 Liquid Nitrogen Low temperature: 100-400K Main functions 1. Crystal Structure Determination (including unit cell checking, space...
Multipurpose X-Ray Diffractometer
Main specifications 1. Empyrean tube Cu LFF (HR): maximum voltage 50kV, maximum current 55mA, maximum power 1.8kW 2. scanning mode：θ/θ vertical geometry, mnimum step width: 0.0001° 3. Measurement Radius：240 mm Direct optical positioning and equipping with DC motors，angular accuracy 0.001° 4. PIXcel3D 2D Area detector 5. 5-Axis cradle (Chi-Phi-X-Y-Z) 6....
High Throughput Powder X-Ray Diffractometer
Main specifications 1. Empyrean tube Cu LFF (HR): maximum voltage 50kV, maximum current 55mA, maximum power 1.8kW 2. scanning mode：θ/θ vertical geometry, minimum step width: 0.0001° 3. Measurement radius：240 mm Direct optical positioning and equipping with DC motors, angular accuracy 0.001° 4. Standard and rotating reflectivity sample stage with 45...
X-Ray 3D Microscope (Micro-CT)
Main specifications 1. 光电耦合物镜探测器，物镜0.4X的最大三维视野50mm；物镜40X最高空间分辨率500nm。 2. X射线源最高工作电压160kV，最大功率10W。 3. 最大可测样品尺寸φ300mm×450mm。 4. 原位测试力值最大5KN，轴向位移最大10mm，轴向位移速度0.1mm/min -1mm/min。 5. 原位拉伸试验台的温度范围 -20℃ ~+160℃。 Main functions 1. 利用X射线穿透样品，探测器收集不同吸收信号，实现X射线全场成像 2. 可以对材料内部结构无损测试，并进行三维重构和切片表征 3. 复合材料、多孔材料、建筑材料、岩石三维孔隙结构、特征提取和定量分析与统计分布 4. 增材制造、金属、陶瓷内部缺陷检测；生成三维网格模型用于数值模拟计算或3D打印；电池、芯片、热电材料的失效分析 5. 纤维材料的取向分析；动植物组织学成像分析；材料拉伸或压缩断裂行为和加热试验的原位表征。 Precautions for sample testing 设备属于II类射线装置，按法规要求只容许已登记辐射工作人员操作，因此只接受送样测试，如有特别需要请联系管理员
Benchtop Powder X-Ray Diffractometer
Main specifications 1. Empyrean tube Cu LFF (HR): generator voltage 40kV, Current 7mA, maximum power 600kW 2. scanning mode：θ/θ vertical geometry, minimum step width: 0.0001° 3. Measurement radius：145 mm 4. Standard sample stage, 6 position autosampler 5. PIXcel1D 1D Strip detector Main functions 1. Phase identification and quantification analysis 2....
Atom Probe Tomography
Main specifications 1. Vacuum system of vacuum chamber: Level3, vacuum of the analysis chamber<1×10^-10 torr; 2. Max. voltage pulse frequency: 500 kHz; 3. Max. laser pulse frequency: 400kHz; 4. UV laser wavelength: 257.5nm; Finest focal spot:<3 µm； 5. Max. data collection rate ions/min: > 4M； 6. Time of Flight (TOF)...
Time-of-Flight Secondary Ion Mass Spectrometry with Orbitrap analyzer
Main specifications 1. Bi ion source for analysis, ion beam current: >40 nA, maximum repetition rate: 50 kHz (for all modes of operation). 2. Pulsed ion beam current: ≥ 40 pA, minimum pulsed beam diameter: ≤ 50 nm (for high-resolution imaging modes). Fast imaging mode available, minimum beam spot diameter:...
Multi-Technique Surface Analysis System（XPS, AES, UPS, LEIPS）
Main specifications 1. Monochromatic X-ray source system (electron gun, anode target and monochromator) 2. Energy Analyzer: Energy resolution on Ag: ≤ 0.48 eV at Ag3d5/2 (FWHM) 3. Argon Ion Gun Energy: 0 - 5 kV; GCIB argon cluster ion gun maximum energy: 20 kV 4. Energy resolution of Dual-Beam Charge...