PLATFORM

Surface Analysis

Atom Probe Tomography
Model: LEAP 6000XR
Manufacturer: CAMECA
Instrument administrator: Carmen Jiawen QIU
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Time-of-Flight Secondary Ion Mass Spectrometry with Orbitrap analyzer
Model: M6
Manufacturer: IONTOF
Instrument administrator: Carmen Jiawen QIU, Yuxiao HOU
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Multi-Technique Surface Analysis System（XPS, AES, UPS, LEIPS）
Model: PHI VersaProbe4
Manufacturer: ULVAC-PHI
Instrument administrator: Yuxiao HOU
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Nano IR
Model: NeaScope
Manufacturer: Neaspec
Instrument administrator: Sirun HOU
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Research Atomic Force Microscope
Model: Dimension Icon
Manufacturer: Bruker
Instrument administrator: Dennis Sirun HOU, Shengyao Fan
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Multifunctional Atomic Force Microscope
Model: AFM100 Plus
Manufacturer: Hitachi
Instrument administrator: Dennis Sirun HOU, Shengyao Fan
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Surface profiler
Model: Alpha-Step D-600
Manufacturer: KLA-Tencor
Instrument administrator: Dennis Sirun HOU
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