微纳分析

主要规格&技术指标

1. 电子枪: 高亮度肖特基场发射电子枪;

2. TEM模式信息分辨率: 0.12 nm;

3. TEM模式点分辨率: 0.25 nm;

4. STEM 模式分辨: 0.16 nm;

5. 加速电压: 80 kV, 200 kV;

6. 总束电流: >50 nA;

7. 分析束流:>=1.5 nA@1nm (200 kV);

8. 扫描透射(STEM)模式: 高角环形暗场探头(HAADF)、明场探头(BF)、环形暗场探头(ADF);

9. 电子能量损失谱EELS:探测器尺寸: 18μm^2 (2048 × 64 pixels);

10. 能量色散X射线谱EDX能量分辨率: Mn-Kα和10 kcps时<=136 eV (输出）

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主要功能及特色

The Talos F200X transmission electron microscope provides the fastest, most accurate and quantitative multi-dimensional nanomaterial characterization and analysis capabilities. It can realize TEM and STEM imaging, selected area electron diffraction (SAED), energy-dispersive X-ray spectroscopy (EDX), tomography, in-situ heating, etc

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样本检测注意事项

1. Magnetic (e.g. Fe, Co, Ni， Mn)/Biological/Contaminated/Organic samples will NOT BE ALLOWED;

2. For authorized users only;

3. Cancellation or Booking at least 2 days in advance----- Violation of the rules will be disqualified.

Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.

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设备使用相关说明

1. Magnetic (e.g. Fe, Co, Ni， Mn)/Biological/Contaminated/Organic samples will NOT BE ALLOWED;

2. For authorized users only;

3. Cancellation or Booking at least 2 days in advance----- Violation of the rules will be disqualified.

Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.