全自动多用气体吸附仪
Main specifications 相对压力测试范围：1.3 x 10e-9 to 1.0 P/P0 分析站数量：3个 压力传感器测量精度：1000 torr 0.12% reading， 10 torr 0.12% reading，0.1 torr 0.15% reading， 脱气站数量：6个 脱气站脱气温度范围：室温-400摄氏度 原位脱气温度范围：室温-300摄氏度 比表面积范围：最小0.0005m2/g 孔径分析范围：3.5 Å - 5000 Å 可选吸附气体：氮气，二氧化碳等 吸附温度控制系统：液氮，ISO Controller (0-70摄氏度） Main functions Micromeritics 3Flex是一款全自动运行的气体吸附仪，采用真空容量法原理，配置独立的脱气系统，仪器分析站和脱气站各具有独立真空系统。此仪器测得多孔材料进行吸附/脱附等温线，对数据分析后可得到多孔材料的比表面积、孔体积、孔径分布等相关信息。仪器具有超洁净歧管设计，每个分析站配有独立压力传感器，采用三级传感器，包括1000torr，10torr，0.1torr，适用于分子筛、MOFs等微孔介孔多空材料分析研究，在材料，医药、陶瓷、活性炭、炭黑、催化剂、储氢材料、燃料电池、锂电池等领域有广泛的应用。 Notes 预约为主机测试时间，测试前需要预处理样品，脱气，干燥，请根据样品测试需求，预留此时间。
椭偏仪
Main specifications 1. Wide spectral range 193~1690 nm; 2. Automatic angle-changing base:45-90°; 3. Z axis: automatic movement, maximum stroke 18mm, minimum step size 1um; 4. Spot size: normal spot 4mm in diameter, micro spot 300um in diameter; 5. Measurement parameters include: spectral ellipsometry Ψ and Δ; percentage of transmitted and...
台阶仪
Main specifications 1. Highest resolution: 0.38 Å 2. Testing repeatability: 5.0 Å or 0.1% 3. Minimum positive pressure during scanning: 0.03 mg 4. Total Number of measured sampling points: 400,000 5. Measuring range: 1200um 6. Sample stage XY motor drive: 150×150mm 7. Sample stage size: ≥120mm Main functions 1.Equipped with...
能量色散X射线荧光光谱仪
Main specifications 1. 15W Ultra high performance X-ray Tube with a Rhodium anode 2. 30mm2SDD Drift Detector, with temperature and pressure sensors 3. 7 filters (blank, Cu500μm, Al50μm, Al200μm, Ti7μm，Ag100μm, Cu300μm) 4. Standard sample stage, 10 position autosampler 5. He gas purging for light elements analysis Main functions 1. Elemental...
高对比度透射电子显微镜
Main specifications 1. Electron Source: high-brightness Schottky X-FEG electron source; 2. TEM mode information limit: 0.18 nm; 3. TEM mode point resolution: 0.30 nm; 4. STEM HAADF mode resolution: 0.20 nm; 5. Accelerating Voltage: 80 kV, 200 kV; 6. Probe current:>=1.2 nA@1nm (at 200 kV); 7. Scanning transmission (STEM) mode:...
高分辨率透射电子显微镜
Main specifications 1. Electron Source: high-brightness Schottky X-FEG electron source; 2. TEM mode information limit: 0.12 nm; 3. TEM mode point resolution: 0.25 nm; 4. STEM HAADF mode resolution: 0.16 nm; 5. Accelerating Voltage: 80 kV, 200 kV; 6. Total beam current: >50 nA; 7. Probe current:>=1.5 nA@1nm(at 200kV); 8....
超高分辨率扫描电子显微镜 (SEM) Regulus8230
Main specifications 1. Electron gun: Cold cathode field emission electron source; 2. Resolution：0.6nm@15kV ,0.7nm@1kV; 3. Magnification： 20 ~ 2,000,000x； 4. Accelerating voltage: 0.5 ~ 30 kV； 5. Landing voltage: 0.01 ~ 20 kV； 6. Specimen Stage: 6 ""specimen exchange device; 110×110mm 5 Axis motorized stage（XY: 0 ~110mm; Z: 1.5~40mm; R:...
超高分辨率扫描电子显微镜 Regulus8100
Main specifications 1. Electron gun: Cold cathode field emission electron source; 2. Resolution：0.7nm@15kV ,0.8nm@1kV; 3. Magnification： 20 ~ 1,000,000x； 4. Accelerating voltage： 0.5 ~ 30 kV； 5. Landing voltage：0.1 ~ 2 kV； 6. Specimen Stage：4""specimen exchange device； 7. EDX dector：Oxford AZtecLive UltimMax 65; 8. Equipped with vaccum transfer system; Main...
高分辨率扫描电子显微镜(SEM)
Main specifications 1. Electron Gun：Schottky Field Emission； 2. Resolution：1.2nm@30kV, 3.0nm@1kV； 3. Magnification： 10 ~ 600,000x； 4. Accelerating voltage： 0.5 ~ 30 kV； 5. Variable pressure mode：10~300Pa; 6. Specimen Stage：Maximum sample size: 200mm dia. x 80mmH; 100×50mm 5 Axis motorized stage (X: 0~100mm; Y: 0~50mm; Z: 3~65mm; R: 360o; T: -20...